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Ing. Vlasta Juránková, CSc.
Papers in conference proceedings
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Chobola Z., Luňák M., Juránková V., Vaněk J., Bařinka R.: Low-frequency noise and microplasma measurements as a faster tool to investigate the quality of monocrystalline-silicon solar cells. in: Proc. of SPIE 2012, 16-19 April 2012, Brussels, ed. by SPIE USA, 2012, 843129-1-843134, ISBN 9780819491237 |
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